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Nanocharacterisation [Hardcover]

Item : Nanocharacterisation [Hardcover]
Price : $256.99 (see below)
Category : Books
ISBN-10 ISBN-10 : 184973805X
ISBN-13 ISBN-13 : 9781849738057
Publisher Publisher : Royal Society of Chemistry
Pages Pages : 358
Binding Binding : Hardcover
Item ID : 100096484

Following on from the success of the first edition, this new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods used to study nanostructured materials. With contributions from internationally recognised experts, each chapter focuses on a different technique to characterise nanomaterials providing experimental procedures and applications. This indispensable resource will appeal to academics, professionals and anyone working fields related to the research and development of nanocharacterisation and nanotechnology.This new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods for nanostructured materials.A I Kirkland is Professor of Materials at Oxford University and the author of over 170 refereed papers. He was awarded best materials paper of 2005 by the Microscopy Society of America. Since 2000 he has also been involved in the characterisation of CCD cameras for TEM. His most recent work involves the development of approaches to complex phase extension and diffractive imaging to further improve resolution.Nanocharacterisation provides an overview of the main characterisation techniques that are currently used to study nanostructured materials. Following on from the success of the first edition, this new edition has been fully revised and updated to reflect the recent developments in instrumental characterisation methods. With contributions from internationally recognised experts, each chapter focuses on a different technique to characterise nanomaterials providing experimental procedures and applications. State of the art characterisation methods covered include Transmission Electron Microscopy, Scanning Transmission Electron Microscopy, Scanning Probe Microscopy, Electron Energy Loss Spectroscopy and Energy Dispersive X-ray Analysis, 3D Characterisation, Scanning Electron and Ion Microscopy and In situ Microscopy. Essentially a handlór

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