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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [Paperback]

Item : Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits [Paperback]
List Price  : $199.99
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Category : Books
Code : 9781441942852
Author Author : Sachdev, Manoj, Pineda de Gyvez, Jos?
ISBN-10 ISBN-10 : 1441942858
ISBN-13 ISBN-13 : 9781441942852
Publisher Publisher : Springer
Binding Binding : Paperback
Item ID : 102586021
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